Proceedings
Authors
| Filter results3 paper(s) found. |
|---|
1. sUAVS Technology For Better Monitoring Crop Status For Winter CanolaThe small-unmanned aircraft vehicles (sUAVS) are currently gaining more popularity in agriculture with uses including identification of weeds and crop production issues, diagnosing nutrient deficiencies, detection of chemical drift, scouting for pests, identification of biotic or abiotic stresses, and prediction of biomass and yield. Research information on the use of sUAVS have been published and conducted in crops such as rice, wheat, and corn, but the development of... I.A. Ciampitti, K. Shroyer, V. Prasad, A. Sharda, M.J. Stamm, H. Wang, K. Price, D. Mangus |
2. Coupling Machine Learning Algorithms and GIS for Crop Yield Predictions Based on Remote Sensing Imagery and Topographic IndicesIn-season yield prediction can support crop management decisions helping farmers achieve their yield goals. The use of remote sensing to predict yield it is an alternative for non-destructive yield assessment but coupling auxiliary data such as topography features could help increase the accuracy of yield estimation. Predictive algorithms that can effectively identify, process and predict yield at field scale base on remote sensing and topography still needed. Machine learning could be an alternative... M.F. Oliveira, G.T. Morata, B. Ortiz, R.P. Silva, A. Jimenez |
3. Multi-sensor Remote Sensing: an AI-driven Framework for Predicting Sugarcane FeedstockPredicting saccharine and bioenergy feedstocks in sugarcane enables stakeholders to determine the precise time and location for harvesting a better product in the field. Consequently, it can streamline workflows while enhancing the cost-effectiveness of full-scale production. On one hand, Brix, Purity, and total reducing sugars (TRS) can provide meaningful and reliable indicators of high-quality raw materials for industrial food and fuel processing. On the other hand, Cellulose, Hemicellulose,... M. Barbosa, D. Duron, F. Rontani, G. Bortolon, B. Moreira, L. Oliveira, T. Setiyono, L. Shiratsuchi, R.P. Silva, K.H. Holland |