Authors
| Filter results4 paper(s) found. |
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1. A Model For Wheat Yield Prediction Based On Real-time Monitoring Of Environmental Factors... B. Dumont, F. Vancutsem, J. Destain, B. Bodson, F. Lebeau, M. Destain |
2. Assessing the Potential of an Algorithm Based On Mean Climatic Data to Predict Wheat YieldIn crop yield prediction, the unobserved future weather remains the key point of predictions. Since weather forecasts are limited in time, a large amount of information may come from the analysis of past weather data. Mean data over the past years and stochastically generated data are two possible ways to compensate the lack of future data. This research aims to demonstrate that it is possible to predict... F. Vancutsem, V. Leemans, S. Ferrandis vallterra, B. Bodson, J. Destain, M. Destain, B. Dumont |
3. Nitrogen Fertilisation Recommendations : Could They Be Improved Using Stochastically Generated Climates In Conjunction With Crop Models ?In the context of precision nitrogen (N) management, to ensure that the yield potential could be reached each year, farmers have too often applied quantities of fertilizers much larger than what was strictly required. However, since 2002, the Belgian Government transposed the European Nitrate Directive 91/676/EEC in the Belgian law, with the aim to maintain the productivity and the revenue of Belgian's farmers while reducing the environmental impact of excessive N management... B. Basso, J. Destain, B. Bodson, M. Destain, B. Dumont |
4. Detection of Nitrogen Stress on Winter Wheat by Multispectral Machine VisionHand-held sensors (SPAD meter, N-Tester, …) used for detecting the leaves nitrogen concentration (Nc) present several drawbacks. The nitrogen concentration is gained by an indirect way through the chlorophyll concentration and the leaves have to be fixed in a defined position for the measurements. These drawbacks could be overcome by an imaging device that measures the canopy reflectance. Hence, the objective of the paper is to analyse the potential of multispectral imaging for detecting... M. Destain, V. Leemans, G. Marlier, J. Goffart, B. Bodson, B. Mercatoris, F. Gritten |